December 4th, 2025 (1:30-4:30 pm)
New York Room, Holiday Inn Shanghai Pudong Kangqiao
No.55, Huanlong Road, Pudong New Area, Shanghai, China
As Ethernet-APL technology continues to gain traction, product verification has become a critical step in ensuring device compatibility and system reliability. Whether you’re a device manufacturer, system integrator, or end user, challenges often arise during development and deployment — such as unclear testing standards, difficulty selecting verification tools, or gaps in project coordination.
To address these issues, we are pleased to host the APL Product Verification & Demonstration Exchange Session, where we will share insights into verification standards, system architecture, and hands-on testing tools. We hope this session will foster meaningful discussion and provide practical guidance for navigating real-world development and implementation challenges.
Workshop Will Cover the Following Information:
Session Highlights
– Introduction to Ethernet-APL verification standards
– Overview of the verification test system architecture
– Live demonstration and explanation of test cases
– Ethernet-APL cable tester demonstration
– Open Q&A and discussion session
Required Test Equipment Needed for Testing
-Channel Emulator
-Multifunction Probe
-Reference Link Partner
-Programmable DC Power Supply
-Programmable DC Load
-Arbitrary Waveform Generator
-Vector Network Analyzer
-Digital Storage Oscilloscope
Test Cases and Functionality
Transmitter Output Voltage, Transmitter Output Droop, Transmitter Timing Jitter, Transmitter Power Spectral Density (PSD) and Power Level, Transmit Clock Frequency, MDI Return Loss, Transmitter Distortion, Receiver Packet Error Rate Stress Test, Transmit Signaling, Automatic Polarity Detection and Correction, Handling of Received ESD_ERR4, Handling of Received CRC Errors, Advertisement and Auto-Negotiation Verification, Management Restart of Auto-Negotiation, Link Status Fail, DME Voltage Envelope Test, Auto-Negotiated Link-Up Time, Minimum Current Draw, Inrush Current events, Differential In-Band Ripple and Noise, Differential Out-Band Ripple and Noise, Current Derivatives, Current Events, Under Voltage Current, Polarity Sensitivity, and more
The Hands-On Portion of the Workshop will Include:
-Testing of Live SPE Switch and End Device Sensor
-Testing of Ethernet-APL devices
-Review of Test Results, Including Set Up and Purpose of Test