
Telebyte’s SPE / APL Testing Workshop
December 9th, 2024 (1:00-4:00 pm)

Holiday Inn Shanghai Pudong NANPU Hotel
No.55, Huanlong Road, Pudong New Area, Shanghai, China
With the vigorous development of breakthrough technologies such as digitalization, cloud technology, AI, etc., and their combined and variable use among each other, more efficient applications and superior user experiences have the potential to affect all aspects of humanity. However, the terminal devices in “process control” and various types of “management automation” have been somewhat lagging behind the actual demands due to inherent technical or normative specifications.
The long-held concept of Ethernet end-to-end is based on this demand. The emergence of new single-pair Ethernet standards such as IEEE 802.3cg, IEEE P802.3dg, and Ethernet-APL will play a major role in rapid realization over the years. From Chips to various switches and field devices, products have been introduced around the world, one after another because these standards make verifiable results possible. China is a strong country in production in various fields globally and a leader in advanced applications. It will develop faster and further on this new technological basis. It is hoped that this seminar will introduce technology, applications, market, and testing information to relevant user institutions.
This informative and hands on workshop will provide valuable information that will enable you to accelerate the development of your 10BASE-T1L or Ethernet-APL product.
Workshop Will Cover the Following Information (In English):
IEEE Standards
-IEEE 802.3–2022 10BASE-T1L Physical Layer Specification and Management Parameters
-IEEE 802.3dd Power over Data Lines of Single Pair Ethernet
Relevant Test Standards
-Ethernet-APL Power and Data Test specifications
Required Test Equipment Needed for Testing
-Channel Emulator
-Multifunction Probe
-Reference Link Partner
-Programmable DC Power Supply
-Programmable DC Load
-Arbitrary Waveform Generator
-Vector Network Analyzer
-Digital Storage Oscilloscope

Test Cases and Functionality
Transmitter Output Voltage, Transmitter Output Droop, Transmitter Timing Jitter, Transmitter Power Spectral Density (PSD) and Power Level, Transmit Clock Frequency, MDI Return Loss, Transmitter Distortion, Receiver Packet Error Rate Stress Test, Transmit Signaling, Automatic Polarity Detection and Correction, Handling of Received ESD_ERR4, Handling of Received CRC Errors, Advertisement and Auto-Negotiation Verification, Management Restart of Auto-Negotiation, Link Status Fail, DME Voltage Envelope Test, Auto-Negotiated Link-Up Time, Minimum Current Draw, Inrush Current events, Differential In-Band Ripple and Noise, Differential Out-Band Ripple and Noise, Current Derivatives, Current Events, Under Voltage Current, Polarity Sensitivity, and more
The Hands-On Portion of the Workshop will Include:
-Testing of Live SPE Switch and End Device Sensor
-Testing of Ethernet-APL devices
-Review of Test Results, Including Set Up and Purpose of Test
SPE Testing Workshop Registration Form: